PAPER SUBMISSION GUIDELINES:

Authors are requested to submit electronically a PDF file paper(s) only to the following link: Deadline for paper submission has expired (PAPER SUBMISSION).

Accepted papers include Engineering Index (EI) and EI Compendex.

Elsevier publishing house will be receiving all the titles of the accepted papers from IEEE AICT2009 conference for inclusion in its databases, including Engineering Index (EI) and EI Compendex.

Identification numbers, the IEEE catalog number and ISBN will be assigned to AICT2009 accepted papers.

Papers title, author names and addresses and Emails, paper abstract and keywords should be written in English and should preferably follow the instructions in Template others parts of the paper can be written in your native language as Azerbaijani, Turkish or Russian languages.

Preferred maximum paper length is 5 printed pages (10-point font) including figures. IEEE will accept papers for review up to 7 pages in length. Accepted papers that are longer than 5 pages will be charged an over length fee of $100 USD for 6 pages and $200 USD for 7 pages. Under no circumstances may any submission should exceed 7 pages. Papers in excess of 7 pages shall not be considered for review or publication. The cover page is not included in the page count. The title of the paper, author's name, affiliation, complete return address, telephone number, facsimile number and e-mail address should appear at the top of the first page followed by an abstract with a maximum of 100 words. Authors must state that their paper has neither been published before nor currently being submitted elsewhere. Accepted papers will be published in the conference's proceedings and/or CD-ROMs and the publication will be available on IEEE XploreTM. Selected papers will also be published in a journal.

For additional information concerning paper submission, Please contact general chairs: Guy Omidyar or Abzetdin Adamov or just fill the Contact Us form.

Note: The final submission of accepted papers (Camera ready) must be in accordance to publisher’s formatting standard IEEE Xplore at: IEEE Xplore